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AVX Technical Information > Tantalum & Niobium Capacitors

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Document Title Author Date Technical Paper
Thermal & Electrical Breakdown Versus Reliability of Ta2O5 Under Both Bipolar Biasing Conditions P. Vasina, T. Zednicek, Z. Sita, J. Sikula 7/5/2011 11:26:00 AM Thermal & Electrical Breakdown Versus Reliability of Ta2O5 Under Both  Bipolar Biasing Conditions
Thermal Management of Surface Mounted Tantalum Capacitors Ian Salisbury 7/5/2011 11:27:00 AM Thermal Management of Surface Mounted Tantalum Capacitors
Ultrathin Discrete Capacitors for Emerging Embedded Technology Radim Uher & Tomas Zednicek 10/24/2012 2:35:00 PM Ultrathin Discrete Capacitors for Emerging Embedded Technology
Voltage Derating Rules for Solid Tantalum & Niobium Capacitors T. Zednicek, J. Gill 10/24/2012 2:28:00 PM Voltage Derating Rules for Solid Tantalum & Niobium Capacitors
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